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Advances in X-Ray Analysis: Volume 31 by E. F. Skelton (auth.), Charles S. Barrett, John V.

By E. F. Skelton (auth.), Charles S. Barrett, John V. Gilfrich, Ron Jenkins, John C. Russ, James W. Richardson Jr., Paul K. Predecki (eds.)

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The basic techniques are similar, but the sensitivity of the method to various artefacts resulting from finite noise, nonlinear dependence of absorption on density or other structure, and of course the practical implementation in hardware may be quite different. 33 JOHN C. RUSS Ab orption Tomography Emi sion Tomography Compton ScatterTomography Fluorescence Tomography Figure 8. Some additional methods for tomography Traditional absorption tomography measures the attenuation of the primary beam along each path (or, for ultrasound and seismology, the chal1'ge in time of flight).

All of these methods (and many more than can even be listed in this introductory article) are capable of providing information about the internal structure of objects that can be of great importance in research and industry. The problems of theory, design, and application are much greater for materials than for medical use, because of the greater diversity of objects and composition encountered. ), detectors (including 1- and 2-D arrays of solid state detectors, perhaps with energy discrimination 34 I.

The precipitate is Laves phase (hexagonal, nominally FeLNb) in an FCC matrix. Crystalline defects are also visible in the image. Material is a dissimilar weld between a Ni based alloy (Inconel 625) and a stainless steel (304). The SADP was taken with the electron beam parallel to (112) in the matrix and (1120) in the Laves phase. Courtesy of T. J. Headley. 17 A . ROMIG, Jr . 313nm FIGURE 4 Lattice image of Si0 2 on Si. Courtesy of T. J . Headley. (111) lattice fringes in Si are visible. images are really intereference images.

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