By Gerald R. Lachance (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Gregory J. McCarthy, Paul K. Predecki, Richard Ryon, Deane K. Smith (eds.)
Whole trend becoming, Rietveld research, and Calculated Diffraction styles. Quantitative section research via XRay Diffraction (XRD). skinny movie and floor Characterization by way of XRD. Lattice Defects and XRay Topography. Texture research by means of XRD. XRD Instrumentation, innovations, and Reference fabrics. rigidity choice by way of Diffraction equipment. XRD Profile becoming, Crystallite measurement and pressure choice. XRD purposes: Detection Limits, Superconductors, Organics, Minerals. Mathematical tools in XRay Spectrometry (XRS). skinny movie and floor Characterization by means of XRS and XPS. overall mirrored image XRS. XRS recommendations and Instrumentation. XRS purposes. XRay Imaging and Tomography. 161 articles. Index.
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Extra resources for Advances in X-Ray Analysis: Volume 35B
SUMMARY 1. As the results of these investigations the authors elaborated on the base of the method of least-squares fIt with digital fIltering mathematical algorithm and software for processing spectrometric data from experiments in EDXRF. 2. Quality and reliability of results correspond to the high requirements of EDXRF-spectrometry. 3. In the framework of the new software there are different possibilities for active choice of parameters for processing data, flexible control, objective estimation of current procedures and fInal results.
The NCSXRF code can be used for obtaining such 734 X. MATHEMATICAL METHODS IN XRS "I ~ ....... From Cu-20ll: Zn-60lI: alloy Une: From Cu-80ll: Zn-20ll: alloy . I ~ "I .... 0 ~~ " " .. W 1J II> I 0 ~~ " 0 u j "I ~ "I ~ 5 4 6 7 8 9 10 11 Energy (kev) Fig. 5 Zn Element Library Spectra elemental library spectra directly. The authors have used the MCLLS method to analyze many other sample compositions (Verghese, Mickael, He, and Gardner, 1988) with excellent results. More than one iteration through the Monte Carlo loop is rarely necessary if the initial guessed composition is fairly close to the actual.
D. ·i·n·,u Sj J Jk Jk Jk ( 9 ) The index j defines the ionized atomic level of the chemical element under investigation and k is the origin of the electron filling up the j-vacancy. Thus CuKa1 is described by j=K and k=L3. liS. is the intensity factor, R is the backscatteJ ring factor, w. is the fluorescence yield, P'k is the transiJ J tion probability and f(:t'jk) describes the absorption of characteristic photons of the energy Ejk in the target. is the detector efficiency. b. 5 ~ Sj Zoo 0 E.